发明名称 Electrostatic discharge (ESD) protection structure and a circuit using the same
摘要 An electrostatic discharge (ESD) protection structure is disclosed. The ESD protection structure comprises an active device. The active device includes a plurality of drains. Each of the drains has a contact row and at least one body contact row. The at least one body contact row is located on the active device in a manner to reduce the amount of voltage required for triggering the ESD protection structure. A system and method in accordance with the present invention utilizes a LDNMOS transistor as ESD protection element with optimised substrate contacts. The ratio of substrate contact rows to drain contact rows is smaller than one in order to reduce the triggering voltage of the inherent bipolar transistor.
申请公布号 US2007120190(A1) 申请公布日期 2007.05.31
申请号 US20050254387 申请日期 2005.10.20
申请人 ATMEL CORPORATION 发明人 SCHWANTES STEFAN;GRAF MICHAEL;DUDEK VOLKER;MILLER GAYLE W.JR.;RATHBUN IRWIN;GROMBACH PETER;KLAUSSNER MANFRED
分类号 H01L23/62 主分类号 H01L23/62
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