发明名称 Chemical mechanical polishing method
摘要 A method of forming a structure, an array of structures and a memory cell, the method of fabricating a structure, including: (a) forming a trench in a substrate; (b) depositing a first layer of polysilicon on a surface of the substrate, the first layer of polysilicon filling the trench; (c) chemical-mechanical-polishing the first layer of polysilicon at a first temperature to expose the surface of the substrate; (d) removing an upper portion of the first polysilicon from the trench; (e) depositing a second layer of polysilicon on the surface of the substrate, the second layer of polysilicon filling the trench; and (f) chemical-mechanical-polishing the second layer of polysilicon at a second temperature to expose the surface of the substrate, the second temperature different from the first temperature.
申请公布号 US7223697(B2) 申请公布日期 2007.05.29
申请号 US20040710604 申请日期 2004.07.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BROOKS GARTH A.;PORTH BRUCE W.;SHANK STEVEN M.;WHITE ERIC J.
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
主权项
地址