| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection system used with satisfactory operability in response to a using mode, without preparing a processing sequence by an operator itself. SOLUTION: In this X-ray inspection system 1 displayed selectively with any out of a plurality of different screen patterns including a screen pattern P1 for an observation mode and a screen pattern P2 for a measuring mode, on a monitor screen of a display, and formed with a selection switch for starting up a function execution program by an indication using a pointing device, in one part of the each screen pattern, the selection switch 24c is allocated with the function execution program of high using frequency out of the the function execution programs related to the screen patterns, in response to the screen patterns P1, P2 under display in the present. COPYRIGHT: (C)2007,JPO&INPIT
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