摘要 |
<p>The method involves illuminating a measuring object (10) in two phases with a local-specific time period, where a camera (1) picks up the image of the object in each phase. The measured intensity values of the phases are offset with one another, for a subset of the image point. The correspondence of the image point on the epipolar lines is formed by comparing the offset result to the image point on the epipolar lines. An independent claim is also included for an arrangement for the production of a spacer image.</p> |