发明名称 |
FORMING METHOD OF INTERMEDIATE LAYER FORMED BETWEEN BASE MATERIAL AND DLC FILM, DLC FILM FORMING METHOD, AND INTERMEDIATE LAYER FORMED BETWEEN BASE MATERIAL AND DLC FILM |
摘要 |
An intermediate layer forming method to form an intermediate layer formed between a base material and a DLC film using a PVD method includes: a Ti layer film-forming step of film-forming a Ti layer on a base material; and a TiC layer film-forming step of film-forming a TiC layer on the Ti layer, in which in the Ti layer film-forming step, an Ar gas is supplied into a chamber into which the base material is carried and a film-forming pressure is set to a pressure in a range of not less than 0.4 Pa and not more than 1 Pa to film-form the Ti layer, and in the TiC layer film-forming step, an Ar gas and a CH4 gas are supplied into the chamber, a film-forming pressure is set to a pressure in a range of 0.2 Pa or more to less than 0.4 Pa, and a second bias voltage higher in bias voltage than a first bias voltage applied to the base material in the Ti layer film-forming step and higher in bias voltage than −100 V is applied to the base material to film-form the TiC layer. |
申请公布号 |
US2016265099(A1) |
申请公布日期 |
2016.09.15 |
申请号 |
US201415034835 |
申请日期 |
2014.11.06 |
申请人 |
DOWA THERMOTECH CO., LTD. |
发明人 |
Watanabe Motohiro;Matsuoka Hiroyuki;Sakakibara Wataru;Nogami Soichiro |
分类号 |
C23C14/22;C23C14/06 |
主分类号 |
C23C14/22 |
代理机构 |
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代理人 |
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主权项 |
1. An intermediate layer forming method to form an intermediate layer formed between a base material and a DLC film using a PVD method, the method comprising:
a Ti layer film-forming step of film-forming a Ti layer on a base material; and a TiC layer film-forming step of film-forming a TiC layer on the Ti layer, wherein in the Ti layer film-forming step, an Ar gas is supplied into a chamber into which the base material is carried and a film-forming pressure is set to a pressure in a range of not less than 0.4 Pa nor more than 1 Pa to film-form the Ti layer, and in the TiC layer film-forming step, an Ar gas and a CH4 gas are supplied into the chamber, a film-forming pressure is set to a pressure in a range of 0.2 Pa or more to less than 0.4 Pa, and a second bias voltage higher in bias voltage than a first bias voltage applied to the base material in the Ti layer film-forming step and higher in bias voltage than −100 V is applied to the base material to film-form the TiC layer. |
地址 |
Tokyo JP |