发明名称 |
System and method for testing packaged devices using time domain reflectometry |
摘要 |
A test system configured to detect discontinuities in packaged devices. A test unit includes a pulse generator and a sampling circuit. The packaged device is coupled to the test unit via a test fixture. The test unit is configured to transmit a pulse to the packaged device through the test fixture, receive a reflected signal from the packaged device through the test fixture in response to the transmitted pulse, and analyze the reflected signal to detect a discontinuity within the packaged device and/or determine the location of a discontinuity within the packaged device. The test system is configured to store a calibration dataset which includes a set of sample values corresponding to a time domain reflectometry (TDR) test of a calibration packaged device. The test unit is configured to compare data corresponding to the reflected signal to stored values of the calibration dataset to detect a discontinuity in the packaged device.
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申请公布号 |
US7206703(B1) |
申请公布日期 |
2007.04.17 |
申请号 |
US20050120017 |
申请日期 |
2005.05.02 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
PAPAGEORGIOU VASSILIOS;SU MICHAEL ZHUOYING;RAMIREZ AMADO;COUSINS GARY A. |
分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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