发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, DEBUGGING METHOD, AND DEBUGGING SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To debug a system-on-chip semiconductor integrated circuit by means of a small number of signals without setting a special mode, the circuit having a built-in CPU that is not necessarily operating at all times. <P>SOLUTION: This debugging method comprises a step (a) for sending a first signal to the CPU to inquire whether or not the CPU is operating; a step (b) for confirming whether not the CPU is operating according to a second signal received from the CPU; a step (c) for entering into a debugging mode if it is confirmed in the step (b) that the CPU is operating; a step (d) for causing the CPU in the debugging mode to execute a plurality of instructions in sequence that are stored in a debugging memory built in the CPU; and a step (e) for exiting the debugging mode once the execution of the plurality of instructions stored in the debugging memory is complete. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007094475(A) 申请公布日期 2007.04.12
申请号 JP20050279242 申请日期 2005.09.27
申请人 SEIKO EPSON CORP 发明人 MATSUOKA HIROKI
分类号 G06F11/28;G06F11/22 主分类号 G06F11/28
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