| 摘要 |
In one preferred embodiment, a tester for testing an In-Circuit Testing (ICT) bed of nails fixture includes an interface for connecting a cable, wherein the cable is connected to the ICT bed of nails fixture; a probe connected to one of nails of the ICT bed of nails fixture, wherein the probe is grounded; a display device for displaying a number according with a pin of the interface, wherein the pin is connected to the probe through the cable and the one of the nails of the ICT bed of nails; a testing circuit electrically connected to the display device and the interface for testing continuity of the ICT bed of nails fixture; and a power supply providing voltages to the testing circuit. The tester is small enough to be conveniently moved. Thus, testing of the ICT bed of nails fixture may be easily carried out.
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