| 摘要 |
<p>A probes-type shape measurement device has an inclined-axis measurement probe (1) placed with its axis inclined at a predetermined angle relative to the direction vertical to the surface on which an object to be measured is placed, and also has a vertical-axis measurement probe (2) placed with its axis in parallel with the direction vertical to the surface. The entire shape of the object is obtained by connecting measurement data by the probes.</p> |
