发明名称 AQUEOUS POLISHING SLURRY AND CHEMICAL MECHANICAL POLISHING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an aqueous polishing slurry having a high CMP rate and less dishing in manufacturing a semiconductor device such as an IC chip and an LSI, and to provide a chemical mechanical polishing method employing the aqueous polishing slurry. <P>SOLUTION: The aqueous polishing slurry contains an oxidant, a 5-membered ring single-ring compound having three or more nitrogen atoms or a compound in which a complex ring is condensed into this compound, and a compound having an imidazole skeleton or an isothiazoline-3-on skeleton. The polishing method includes a process of polishing while allowing a polished surface to contact a polishing surface in the presence of the aqueous polishing slurry. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007088379(A) 申请公布日期 2007.04.05
申请号 JP20050278336 申请日期 2005.09.26
申请人 FUJIFILM CORP 发明人 KATO TOMOO
分类号 H01L21/304;B24B37/00 主分类号 H01L21/304
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