发明名称 METHOD FOR MEASURING NODE POSITION BY TIME OFFSET INFORMATION AND APPARATUS USING THE SAME
摘要 <p>There is provided a node position measurement apparatus and method including sequentially transmitting measurement impulses corresponding to a plurality of base stations, respectively, to at least one node; receiving time offset information that is a difference in time of receiving the measurement impulses, from the node receiving the measurement impulses; and measuring a position of the node based on the time offset information.</p>
申请公布号 KR100706568(B1) 申请公布日期 2007.04.05
申请号 KR20060066706 申请日期 2006.07.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, WAN JIN;JEONG, MIN SEOP
分类号 H04B7/26 主分类号 H04B7/26
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