发明名称 |
METHOD FOR MEASURING NODE POSITION BY TIME OFFSET INFORMATION AND APPARATUS USING THE SAME |
摘要 |
<p>There is provided a node position measurement apparatus and method including sequentially transmitting measurement impulses corresponding to a plurality of base stations, respectively, to at least one node; receiving time offset information that is a difference in time of receiving the measurement impulses, from the node receiving the measurement impulses; and measuring a position of the node based on the time offset information.</p> |
申请公布号 |
KR100706568(B1) |
申请公布日期 |
2007.04.05 |
申请号 |
KR20060066706 |
申请日期 |
2006.07.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, WAN JIN;JEONG, MIN SEOP |
分类号 |
H04B7/26 |
主分类号 |
H04B7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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