发明名称 Microelectronic device having floating gate protective layer and method of manufacture therefor
摘要 A method of manufacturing a microelectronic device including forming a memory cell having a floating gate located over a substrate, a dielectric layer over the floating gate, and a control gate located over a portion of the dielectric layer, wherein a portion of the dielectric layer is laterally disposed from the control gate. A protective layer is formed over the control gate and the dielectric layer. A mask having an opaque portion over the dielectric layer portion and an opening over the control gate is provided, and the protective layer is patterned employing the mask.
申请公布号 US7199008(B2) 申请公布日期 2007.04.03
申请号 US20040853455 申请日期 2004.05.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TSENG SHIH DER
分类号 H01L21/336;H01L21/28;H01L27/105;H01L27/115;H01L29/423;H01L29/788 主分类号 H01L21/336
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