发明名称 MANUFACTURING METHOD FOR THIN FILM SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To surely obtain a thin film semiconductor at a lower cost and with ease. SOLUTION: The manufacturing method comprises a step wherein the top surface of a semiconductor substrate is changed into a porous layer having a porous surface layer, an intermediate porosity rate layer which is formed below the surface layer and has a larger porosity rate compared with the surface layer, and a high porosity rate layer which is formed inside or on a lower layer of the intermediate porosity rate layer and has a larger porosity rate compared with the surface layer and intermediate porosity rate layer; a step to form a semiconductor film on the porous layer; and a step to separate the semiconductor film from the semiconductor substrate via the porous layer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007081422(A) 申请公布日期 2007.03.29
申请号 JP20060306522 申请日期 2006.11.13
申请人 SONY CORP 发明人 INAKANAKA HIROSHI
分类号 H01L21/02;H01L21/20;H01L21/205 主分类号 H01L21/02
代理机构 代理人
主权项
地址