发明名称 OPERATION CHECK SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an operation check system for integrated circuit boards which easily can make testing of two or more output elements and its disconnection, short circuiting, or other abnormalities. SOLUTION: In this operation check system, common testing electrode 39 is connected to all the testing resistive elements 38 connected with discrete electrode 32 connecting to collectors of individual driver 31. Resistor Rx is amply larger than the testing resistive elements 38. When the driver 31 is off, the electric potential of the common testing electrode 39 turns into a potential v1 of testing power source V1 to be input into a detector 43. When a timing generator 44 sequentially impresses drive signals on the driver 31 and turns on each signal one by one, a current flows between the power source V1 and grounding common wire 45 via the resistor Rx and the testing resistive elements 38, and then the electric potential vs, between the resistor Rx to be the potential of the common testing electrode 39 and the resistance value r38 of the resistive testing elements 38, is input to the detector 43. If the driver 31 has some defects, the detector 43 will not be able to detect the electric potential vs. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007078695(A) 申请公布日期 2007.03.29
申请号 JP20060283392 申请日期 2006.10.18
申请人 CASIO COMPUT CO LTD 发明人 NAKAJIMA MITSUYASU
分类号 G01R31/02;B41J2/05;B41J2/16 主分类号 G01R31/02
代理机构 代理人
主权项
地址