发明名称 METHOD FOR INSPECTING PROJECTOR
摘要 PROBLEM TO BE SOLVED: To detect only an image defect caused by an optical modulation element in a projector having an illuminating light source, the optical modulation element for modulating illuminating light from the light source in response to an image signal, and a projection optical system for projecting an image modulated by the modulation element. SOLUTION: The optical modulation element 1 is moved between predetermined two points to a screen 4. Images A, B are picked up by an imaging apparatus 5 when the element is positioned at the two points, respectively. A defect pixel 12 that is not moved in the images A, B which are picked up by the apparatus at the two points, respectively, is removed as a pixel defect. Based on a remaining defect pixel 11, a pixel defect of the element is detected. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007071785(A) 申请公布日期 2007.03.22
申请号 JP20050261145 申请日期 2005.09.08
申请人 VICTOR CO OF JAPAN LTD 发明人 UEDA SHINGO
分类号 G01M11/00;G02F1/13;G03B21/00;H04N17/04 主分类号 G01M11/00
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