发明名称 LASER MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a laser microscope capable of detecting a second harmonic wave emitted in a direction opposite to the direction in which incident light advances. SOLUTION: The laser microscope according to the invention includes: a laser light source 10; a phase plate 12 by which a phase difference according to an incident position is applied to a laser beam from the laser light source 10; an objective lens 16 by which light transmitted through the phase plate 12 is condensed on a specimen 30; a base-wave cut filter 22 by which a second harmonic wave emitted in a direction opposite to the direction in which a laser beam from the specimen 30 advances is separated from a basic wave reflected by the specimen 30; and a photodetector 19 that detects the second harmonic wave separated from the basic wave by the basic wave cut filter 22. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007065149(A) 申请公布日期 2007.03.15
申请号 JP20050249191 申请日期 2005.08.30
申请人 NANO PHOTON KK 发明人 OIDE TAKAHIRO
分类号 G02B21/06 主分类号 G02B21/06
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