发明名称 |
METHOD OF GE NANOCLUSTERS |
摘要 |
A method for fabricating germanium nano clusters is provided to be usefully applied in fabricating a flash memory device by easily forming germanium nano clusters uniformly embedded in a silicon oxide layer. A silicon oxide layer is formed on a silicon substrate(10). A GeO layer is formed on the silicon oxide layer in oxygen atmosphere of a low density. The GeO layer is transformed into a GeO2 layer and Ge nano clusters(50) wherein the substrate is annealed at the temperature of 600 deg.C. The GeO2 layer is transformed into a SiO2 layer(70).
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申请公布号 |
KR20070024952(A) |
申请公布日期 |
2007.03.08 |
申请号 |
KR20050080618 |
申请日期 |
2005.08.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KHANG, YOON HO;DVURECHENSKY V. ANATOLY |
分类号 |
H01L21/8247 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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