发明名称 POLYMER COMPOUND, RESIST MATERIAL AND PATTERNING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide (1) a new acetal compound useful as a monomer for the production of a photoresist material having excellent adhesiveness and transparency in a photo-lithography to use light of &le;300 nm wavelength, especially KrF or ArF excimer laser light as a light source, (2) a polymer compound having excellent reactivity, rigidity and substrate adhesiveness, (3) a resist material produced by using the polymer compound as a base resin and having good resolution and etching resistance considerably superior to those of conventional material, and (4) a patterning method to use the resist material. <P>SOLUTION: The polymer compound has a weight-average molecular weight of 1,000-500,000 and comprises a repeating unit expressed by general formula (4-1) or (4-2). The resist material produced by using the polymer compound as a base resin is useful for a microfabrication with electron beam or far-ultraviolet ray. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007056270(A) 申请公布日期 2007.03.08
申请号 JP20060247791 申请日期 2006.09.13
申请人 SHIN ETSU CHEM CO LTD 发明人 WATANABE TAKESHI;KANOU TAKESHI;HASEGAWA KOJI;NISHI TSUNEHIRO;NAKAJIMA MUTSUO;TACHIBANA SEIICHIRO;HATAKEYAMA JUN
分类号 C08F32/08;C08G61/08;G03F7/039;H01L21/027 主分类号 C08F32/08
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