发明名称 SEMICONDUCTOR ELEMENT PROVIDED WITH BARRIER METAL SPACER AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor element provided with a barrier metal spacer, and its manufacturing method. SOLUTION: A semiconductor element is provided with: a first metal line formed in a semiconductor substrate; an etch stop film provided with a via plug that is electrically connected with a part of the first metal line and containing a window; an interlayer insulating film comprising a via hole and a trench; and a first barrier metal spacer covering the sidewall of the interlayer insulating film in the via hole, to expose a part of the first metal line and at least the lower end of the sidewall of the etch stop film in the window. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007049148(A) 申请公布日期 2007.02.22
申请号 JP20060214517 申请日期 2006.08.07
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE BOUNG JU;SHIN HEON-JONG;KANG HEE-SUNG
分类号 H01L21/768;H01L23/522 主分类号 H01L21/768
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