| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a component image acquiring method and apparatus for acquiring focused component image without relation of component thickness. <P>SOLUTION: A component 30 sucked by a suction nozzle 1a is moved downward to the focusing surface F2 of the imaging apparatus from the upper part of the imaging apparatus 20, and thereby whether the lower surface of component has passed a detecting surface F1 located at the upper part as long as the predetermined distance L1 from the focusing surface is detected. After the lower surface of component has passed the detecting surface F1, the suction nozzle is further moved downward as long as the predetermined distance L1, and is then stopped to pickup the image of component at this stopping position. In this structure, since an image of the component can be picked up by matching the imaging surface (lower surface) of component with the focusing surface of the imaging apparatus without relation to component thickness, the focused image can always be acquired and component recognizing accuracy can also be improved even if thickness of component is changed. <P>COPYRIGHT: (C)2007,JPO&INPIT |
