发明名称 Barrier coating compositions for photoresist and methods of forming photoresist patterns using the same
摘要 Provided are barrier polymers, barrier coating compositions incorporating such polymers and methods for utilizing such barrier coating compositions for suppressing dissolution of photoresist components during immersion photolithography. The barrier polymers may be synthesized from one or more monomers including at least one monomer having a tris(trimethylsiloxy)silyl group and will have a weight average molecular weight (Mw) of 5,000 to 200,000 daltons. The barrier polymer(s) may be combined with one or more organic solvents to form a barrier coating composition that can be applied to a photoresist layer to form a barrier coating layer sufficient to suppress dissolution of components such as PAG into an immersion liquid during exposure processing. The tris(trimethylsiloxy)silyl group monomer(s) may be combined with other monomers, particularly monomers including a polar group, for modifying the hydrophobicity and/or solubility of the resulting barrier coating layer in, for example, a developing solution.
申请公布号 US2007037068(A1) 申请公布日期 2007.02.15
申请号 US20060447896 申请日期 2006.06.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SANG-JUN;HATA MITSUHIRO
分类号 G03F1/00;G03F7/11;G03F7/20;H01L21/027 主分类号 G03F1/00
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