发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithography apparatus including a projection system configured to project a beam of radiation onto a substrate as an array of sub-beams of radiation and an array of individually controllable elements configured to modulate the sub-beams of radiation. The apparatus also includes a data-path including at least one data manipulation device arranged to at least partly convert data defining a requested pattern to a control signal suitable for controlling the array of individually controllable elements to form substantially the requested pattern on the substrate. The data manipulation device is arranged to carry out the conversion by applying a pseudo-inverted form of a point-spread function matrix to a column vector representing the requested pattern. The point-spread function matrix includes information about the shape and relative position of the point-spread function of each spot to be exposed on the substrate by one of the sub-beams of radiation at a given time.
申请公布号 US2007030470(A1) 申请公布日期 2007.02.08
申请号 US20060546394 申请日期 2006.10.12
申请人 ASML NETHERLANDS B.V. 发明人 TINNEMANS PATRICIUS A.J.;BASELMANS JOHANNES J.M.;JORRITSMA LAURENTIUS C.
分类号 G03B27/54 主分类号 G03B27/54
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