发明名称 |
CHEMICAL MACHINERY POLISHING APPARATUS, PAD CONDITIONER ASSEMBLY AND POLISHING PAD CONDITIONING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a chemical machinery polishing apparatus, a pad conditioner assembly and a polishing pad conditioning method. <P>SOLUTION: The present invention relates to a chemical machinery polishing apparatus 100, a pad conditioner assembly 160, and a polishing pad conditioning method. The chemical machinery polishing apparatus 100 polishes a wafer W by rotating a carrier 130 with the wafer W mounted on its lower surface while supplying slurry 150 to a polishing table 110 with a polishing pad 120 mounted on its upper surface. The chemical machinery polishing apparatus 100 includes the pad conditioner assembly 160, and the pad conditioner assembly 160 conditions the polishing pad 120 by providing a pad conditioning solution 190 to the polishing pad 120, applying ultrasonic vibration to the solution and removing a foreign material from the surface of the polishing pad 120. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007036261(A) |
申请公布日期 |
2007.02.08 |
申请号 |
JP20060206930 |
申请日期 |
2006.07.28 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
PARK MOO-YONG;KIM TAIKO;KIM CHINKO;KIM TONICHI |
分类号 |
H01L21/304;B24B53/017;B24B53/095;B24B53/12 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|