发明名称 ESD PROTECTION CIRCUIT OF SILICON CONTROLLED RECTIFIER STRUCTURE CAPABLE OF OPERATING AT LOW TRIGGERING VOLTAGE
摘要 An electrostatic discharge (ESD) protection circuit is provided. The ESD protection circuit includes: a first conductivity type substrate; a second conductivity type well region formed in a predetermined portion of the substrate; a gate structure including a gate insulation layer and a gate electrode stacked on a selected surface portion of the substrate and separated from the well region with a predetermined distance; a first conductivity type first diffusion region formed in the well region; a second conductivity type second diffusion region formed beneath another selected surface portion of the substrate contacting one side edge of the gate structure; and a second conductivity type third diffusion region, extending from the other side edge of the gate structure into the well region, and electrically connected to the first diffusion region through a resistor.
申请公布号 KR100679943(B1) 申请公布日期 2007.02.08
申请号 KR20040091537 申请日期 2004.11.10
申请人 发明人
分类号 H01L27/04 主分类号 H01L27/04
代理机构 代理人
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