发明名称 Valid-transmission verifying circuit and a semiconductor device including the same
摘要 A valid-transmission verifying circuit and a semiconductor device including the same are provided. The valid-transmission verifying circuit provides data to an output circuit in correspondence with reference data, the valid-transmission verifying circuit comprising: a data receiving terminal receiving the reference data; a valid-transmission verifier including a reference load unit configured to sample the reference data, the data sampling operation is interrupted in response to a sampling control signal to determine whether the data sampling operation has been performed within a sampling time; and a selection switch providing the reference data to one of the normal output circuit and the valid-transmission verifier in response to a mode selection signal.
申请公布号 US2007028154(A1) 申请公布日期 2007.02.01
申请号 US20060493438 申请日期 2006.07.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE CHANG-HWAN
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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