发明名称 APPARATUS FOR WAFER EDGE EXPOSURE
摘要 <p>A wafer edge exposure apparatus is provided to precisely adjust a height of a light source by using an adjusting device, thereby reducing a defective of a product and improving productivity. A wafer edge exposure apparatus includes a wafer chuck on which a wafer is seated, a light source spaced apart from the wafer for radiating a light of a certain wavelength to the wafer, and an adjusting device adjusting a height of the light source. The adjusting device has a body(142) supporting the light source, a stepping motor(143) mounted in the body and having a rotation shaft(145), a helical gear(147) connected to one end of the rotation shaft, a transfer gear(149) meshed with the helical gear, and a transfer guide(148) coupled to the transfer gear.</p>
申请公布号 KR20070009287(A) 申请公布日期 2007.01.18
申请号 KR20050064433 申请日期 2005.07.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, MYUNG KEUN
分类号 H01L21/027 主分类号 H01L21/027
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