发明名称 STRUCTURE COMPRISING TUNABLE ANTI-REFLECTIVE COATING AND METHOD OF FORMING THEREOF
摘要 An interconnect structure in back end of line (BEOL) applications comprising a tunable etch resistant anti-reflective (TERA) coating is described. The TERA coating can, for example, be incorporated within a single damascene structure, or a dual damascene structure. The TERA coating can serve as part of a lithographic mask for forming the interconnect structure, or it may serve as a hard mask, a chemical mechanical polishing (CMP) stop layer, or a sacrificial layer during CMP. ® KIPO & WIPO 2007
申请公布号 KR20070005912(A) 申请公布日期 2007.01.10
申请号 KR20067005435 申请日期 2004.10.12
申请人 TOKYO ELECTRON LIMITED 发明人 WETZEL JEFFREY T.;WANG DAVID C.;LEE ERIC M.;TOMA DOREL IOAN
分类号 H01L21/28;H01L21/027;H01L21/311;H01L21/4763;H01L21/768;H01L29/06;H01L31/0232 主分类号 H01L21/28
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