发明名称 |
FABRICATION OF ALIGNED NANOWIRE LATTICES |
摘要 |
<p>Methodologies associated with fabricating aligned nanowire lattices are described. One exemplary method (100) embodiment includes twist wafer bonding (110) a thin single crystal semiconductor film and a bulk single crystal substrate of the same material. Periodic non-uniform elastic strains present on the surface of the film after twist wafer bonding (110) may be exploited to control the positioning of alloying seeds and thus the location of nanowire growth. The strains that cause the ordering of nanocrystals may be removed via annealing (140) and alloying after the formation of nanocrystal arrays to promote stress-free epitaxial growth (150) of nanowires in a controlled orientation.</p> |
申请公布号 |
WO2007002925(A1) |
申请公布日期 |
2007.01.04 |
申请号 |
WO2006US25778 |
申请日期 |
2006.06.29 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.;WEI, QINGQIAO |
发明人 |
WEI, QINGQIAO |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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