发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device by which a manufacturing cost can be reduced, manufacturing time is reduced and productivity is improved. SOLUTION: A method for manufacturing a semiconductor device comprises a step for forming a first layer comprising a metal on a substrate, a step for forming a second layer comprising an inorganic material on the first layer, a step for forming a third layer comprising a thin film transistor on the second layer, a step for irradiating the first, second and third layers with a laser beam to form an opening part by removing at least the second and third layers, a step for bonding a film to the surface of the third layer, and a step for separating the third layer from the substrate with the inside part of the first layer or the part between the first layer and the second layer as a boundary by using the film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006352100(A) 申请公布日期 2006.12.28
申请号 JP20060138567 申请日期 2006.05.18
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMADA HIROMI;MICHIMAE YOSHITAKA
分类号 H01L21/02;H01L21/20;H01L21/8234;H01L27/08;H01L27/088;H01L27/12 主分类号 H01L21/02
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