发明名称 Semiconductor memory and control method thereof allowing high degree of accuracy in verify operation
摘要 In write/erase verity operations of a memory transistor in a semiconductor memory, control of the semiconductor memory follows the following process. One main bit line is applied to be operative on the select side and another main bit line is applied to be operative on the reference side. On the select side, a sub bit line select transistor is turned on to select a sub bit line having connection to the memory transistor as a target for write/erase verify operations. The target memory transistor is turned on while the other memory transistors connected to the same sub bit line are turned off. On the reference side, a sub bit line select transistor is turned off to bring a sub bit line to a non-selected state.
申请公布号 US7154787(B2) 申请公布日期 2006.12.26
申请号 US20050104602 申请日期 2005.04.13
申请人 RENESAS TECHNOLOGY CORP. 发明人 OMOTO KAYOKO
分类号 G11C11/34;G11C16/06;G11C16/02;G11C16/04;G11C16/34 主分类号 G11C11/34
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