| 摘要 |
In a method and system for testing a device, a tester provides a first plurality of test signals to the device. A test module includes a plurality of logic circuits operable to concurrently execute a plurality of test programs. The concurrent execution of the plurality of test programs generates a second plurality of test signals. The plurality of logic circuits control a plurality of switches in which each one of the plurality of switches is selectively controlled to provide one of the first plurality of test signals and the second plurality of test signals to/from the device.
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