发明名称 |
MOS FIELD EFFECT TRANSISTOR HAVING THICK EDGE GATE INSULATING LAYER PATTERN AND METHOD OF FABRICATING THE SAME |
摘要 |
<p>An MOSFET and a manufacturing method thereof are provided to prevent the generation of a GIDL(Gate Induced Drain Leakage) current by restraining the convergence of an electric field using a thick edge portion of a gate insulating pattern. An isolation region(303) for defining an active region(302) is formed on a semiconductor substrate(301). Source/drain regions are formed in the active region. At this time, a channel region(308) is located between the source/drain regions. A gate electrode(317) is formed on the channel region of the active region. A gate insulating layer is formed between the channel region and the gate electrode. The gate insulating layer has a thick edge portion(323).</p> |
申请公布号 |
KR20060127617(A) |
申请公布日期 |
2006.12.13 |
申请号 |
KR20050048820 |
申请日期 |
2005.06.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, MYOUNG SOO |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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