发明名称 High density capacitor structure
摘要 A capacitor structure for an integrated circuit having at least first, second and third layers, with each layer having first and second conductors, includes multiple sidewall capacitors formed between sidewalls of the first conductor and the second conductor in each layer. Several inter-layer capacitors are formed between the first and second conductors in the first and second layers. Further, via capacitors are formed between sidewalls of adjacent vias corresponding to different conductors. The vias are formed between the second and third layers.
申请公布号 US2006273425(A1) 申请公布日期 2006.12.07
申请号 US20060403392 申请日期 2006.04.13
申请人 KHAN QADEER A;MISRI KULBHUSHAN 发明人 KHAN QADEER A.;MISRI KULBHUSHAN
分类号 H01L29/00 主分类号 H01L29/00
代理机构 代理人
主权项
地址