发明名称 SUBSTRATE APPARATUS FOR MEASURING A PLURALITY OF ITEMS
摘要 PROBLEM TO BE SOLVED: To provide a compactly formed substrate apparatus for measuring a plurality of items, which can smoothly introduce a test liquid to a plurality of independent application parts and of which the constituent parts such as a supply part and the application parts, can be easily formed by mold shaping. SOLUTION: The substrate 11 comprises the one supply part and the plurality of application parts for measuring a plurality of items of the test liquid or applying the test liquid for testing etc. The substrate 11 has a flat plate shape. The plurality of application parts 16 are arranged for the one supply part 12. The supply part 12 is made to communicate with each application part 16 by communication paths 18 and 19, through which the test liquid is made to move. A vent part 20 is provided for a terminal part of the flow of the test liquid for smoothing its flow. The supply part 12 is opened in one surface of the substrate 11, in such a way as to communicate with the other surface, and the inner recessed part for arranging a permeation member 21, through which the test liquid can permeate, is formed in the supply part 12 on the other surface. An outer recessed part for arranging reaction members 22-1 and 22-2 is formed at the periphery of the inner recession part. The side of the other surface of the substrate 11 is blocked by a sealing member 23 for preventing the outflow of the test liquid. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006329872(A) 申请公布日期 2006.12.07
申请号 JP20050155940 申请日期 2005.05.27
申请人 BESERU:KK 发明人 NISHIKAWA AKITOSHI
分类号 G01N33/543 主分类号 G01N33/543
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