| 摘要 |
An apparatus and a method for successively storing test data from a multiple stage test by using a single bank of an e-fuse(electrical-fuse) are provided to reduce the area of an integrated circuit device required in providing a bank of the e-fuse, by reducing wasted space caused by that the e-fuse used in one test is unusable in a next test. An apparatus stores array redundancy data in an integrated circuit device and is formed on the integrated circuit device. A single bank of a storing apparatus is dedicated in storing array redundancy data as to multiple test stages for testing the integrated circuit device. A control logic controls decoding of the encoded array redundancy data stored in the single bank of the storing apparatus. The encoded array redundancy data stored in the single bank of the storing apparatus is array redundancy data generated by multiple test stages for testing an array of more than one devices provided on the integrated circuit device.
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