发明名称 WET CLEANING EQUIPMENT
摘要 A wet cleaning apparatus is provided to reduce a time interval of a wet cleaning process by changing the structure of a cleaning part in a manner that only one bath is used to function as a transfer bath in which a wafer stands by and a first bath for cleaning foreign substances on a processing arm. A wafer is loaded by a loader(51). A cleaning part(65) is disposed as a unit for wet-cleaning the wafer loaded by a loader, including a first QDR(quick dump rinse) bath(57), a chemical bath(60) and a second QDR bath(63) which are sequentially disposed. A processing arm(77) transfers the wafer to each cleaning part according to a process progression. The wafer wet-cleaned by the cleaning part is unloaded by an unloader(73). The wafer stands by in the first QDR bath to which a cleaning agent is supplied to wet-clean the foreign substances on the standing-by wafer and the processing arm. Chemicals are stored in the chemical bath to wet-clean the wafer. A cleaning agent is stored in the second QDR bath to wet-clean the foreign substances on the wafer and the processing arm. A final rinse bath(67) is additionally installed at one side of the second QDR bath in the cleaning part to finally clean the wafer.
申请公布号 KR20060124007(A) 申请公布日期 2006.12.05
申请号 KR20050045705 申请日期 2005.05.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, HYOUN BUM
分类号 H01L21/306 主分类号 H01L21/306
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