发明名称 APPARATUS FOR PLASMA ETCHING
摘要 A plasma etching apparatus is provided to obtain stable etch by forming stably a plasma and to minimize contamination of a process chamber by optimizing the cleaning effect of the process chamber. A plasma etching apparatus comprises a process chamber(100), a gas supply part(110) for supplying etch gas to the process chamber, and a coil assembly(200) for surrounding the upper portion of the process chamber. The coil assembly is provided with a coil(210) and a source power(220) for supplying a power to the coil. The distance between the coil and the process chamber is 4 mm below.
申请公布号 KR20060122162(A) 申请公布日期 2006.11.30
申请号 KR20050044199 申请日期 2005.05.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, HO JOONG
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项
地址
您可能感兴趣的专利