发明名称 Inspection standard setting device, inspection standard setting method and process inspection device
摘要 An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and a distribution of features of products which were determined as defective products at the final inspection for every inspection item or every combination of inspection items based on data of the products stored in the memory device, selects an inspection item whose inspection standard is to be reset from the inspection items or the combinations of the inspection items based on a value of the separation degree. Thus providing a method of appropriately setting an inspection standard for detecting a defect sign during process inspection. Further a process inspection device and inspection standard setting device which implements the same.
申请公布号 US2006271226(A1) 申请公布日期 2006.11.30
申请号 US20060433702 申请日期 2006.05.12
申请人 OMRON CORPORATION 发明人 TASAKI HIROSHI;KOJITANI KAZUTO
分类号 G06F19/00;G01B21/00;G01N21/956;G05B19/418;H05K3/00;H05K3/34 主分类号 G06F19/00
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