发明名称 Method of generating test tone signal and test-tone-signal generating circuit
摘要 A method of generating a test tone signal includes generating a fundamental tone signal, which is a sinusoidal signal having a predetermined frequency; generating a first group of harmonic tone signals having different frequencies that are integral multiples of the predetermined frequency; generating a second group of the harmonic tone signals having different frequencies that are integral multiples of the predetermined frequency, at least part of the second group of the harmonic tone signals having frequencies different from frequencies of the first group of the harmonic tone signals; adding the fundamental tone signal to the first group of the harmonic tone signals to generate a first test tone signal; adding the fundamental tone signal to the second group of the harmonic tone signals to generate a second test tone signal; and outputting the first and second test tone signals at predetermined intervals.
申请公布号 US2006259169(A1) 申请公布日期 2006.11.16
申请号 US20060406691 申请日期 2006.04.19
申请人 SONY CORPORATION 发明人 ASADA KOHEI
分类号 G06F17/00 主分类号 G06F17/00
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