FAILURE DIAGNOSIS METHOD AND FAILURE DIAGNOSIS DEVICE OF INTEGRATED CIRCUIT, FAILURE CANDIDATE SPECIFICATION SYSTEM OF ELEMENT LEVEL, FAILURE DIAGNOSIS PROGRAM OF INTEGRATED CIRCUIT AND MEDIUM RECORDING PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a failure diagnosis method and a failure diagnosis device of an integrated circuit, and a failure candidate specification system of an element level, capable of specifying a failure candidate of the element level, and a failure diagnosis program of the integrated circuit and a medium recording the program. SOLUTION: This method is constituted so that failure spot candidates in a circuit assembly constituted of a cell for achieving a plurality of fundamental logics are specified from layout information (ST5, ST6), and that the failure spot candidates are narrowed by using logic information relative to the failure spot candidates specified from the layout information (ST7-ST9). COPYRIGHT: (C)2007,JPO&INPIT