| 摘要 |
PROBLEM TO BE SOLVED: To provide, at low cost, an input/output characteristics detecting device which can set a plurality of sampling times in a single pulse, with arbitrary timing and measure the input/output characteristics of a semiconductor laser element at each sampling times. SOLUTION: Detecting circuits 30 and 50 for a pulse signal outputted from the semiconductor laser element comprise amplifiers 32 and 52 for the pulse signal, A/D converters 34 and 54, which digitally convert amplified pulse signals, and latch circuits 36 and 56 constituted of three-stage latch ICs. Digital signals corresponding to the pulse signals are inputted to the latch circuits 36 and 56, and one latch timing signal each is input to respective latches IC of three stages, during one pulse of the pulse signal by a timing circuit 40 at points t1, t2, and t3 of time, in the order, from the rising point t0 of time to detect digital signals, corresponding to the crest values of the pulse signals at the points t1, t2, and t3 of the times (sampling times), when latch timing signals are inputted. COPYRIGHT: (C)2007,JPO&INPIT
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