| 摘要 |
To provide a semiconductor integrated circuit that includes a flash EEPROM on which an efficient burn-in test can be carried out and a burn-in test method thereof. By changing the level of a control signal C 1 from the mode selecting unit 40, the operating mode of a functional unit 10 is switched from a normal mode to a test mode for reading out data from a ROM 30 storing a test instruction code. Then, by changing the level of the first control signal C 2 in the test mode, the destination of an output of the first selection circuit 12 and the operation of the program counter 11 are switched, thereby alternately implementing a first burn-in mode for activating a flash EEPROM 20 and a second burn-in mode for activating the functional unit 10.
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