DYNAMIC MEASUREMENT OF THE IMPEDANCE OF MICROWAVE COMPONENTS

摘要

The invention relates to the field involving the dynamic measurement of characteristics relating to an electronic component, whereby said measurement can be taken for a continuous (CW) or pulsed operating mode. More specifically, the invention relates to a method of measuring the dynamic impedance of an electronic component, comprising the following steps: a) a step consisting in stimulating the component, during which a CW signal with a duration of T=T₀+?t is applied at the input of the component at a start time t₀; b) a step consisting in measuring (12) the amplitudes and phases of the incident signal and the reflected signal on the component, said measurement being taken at the stimulated input; c) a step consisting in calculating the instantaneous impedance of the component from the measured signal phases and amplitudes; and d) a step (13) in which the stimulation is stopped. The inventive method is characterised in that the aforementioned steps are repeated iteratively, with duration T of the stimulus and the value of the time interval ?t being incremented with each iteration and two consecutive iterations being separated by an intermediate step (16) during which the component is deactivated such that the internal temperature thereof is once again equal to ambient temperature. The invention is particularly suitable for the dynamic measurement of the non-linear impedance of microwave electronic components such as diodes or transistors.