发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support configured to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table configured to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and a robot configured to transfer an exchangeable object to and from a support region, the robot including an arm and an end effector, the end effector including a first and second carrier configured to carry respective exchangeable objects, and the end effector being rotatably connected to the arm of the robot around a rotation axis which extends substantially parallel to the support region.
申请公布号 US7131999(B2) 申请公布日期 2006.11.07
申请号 US20040950674 申请日期 2004.09.28
申请人 ASML NETHERLANDS B.V. 发明人 HOOGKAMP JAN FREDERIK;KUIT JAN JAAP;VISSER RAIMOND
分类号 G03B27/58 主分类号 G03B27/58
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