发明名称 Impedance measurement in a fluidic microsystem
摘要 Described are a method and a measuring device for measuring the impedance in a fluidic microsystem comprising a compartment ( 10 ) through which a liquid comprising at least one suspended particle ( 16 ) flows, and in which at least one impedance detector ( 40 ) is arranged, by means of which for detection of the at least one particle at least one impedance value is acquired which is characteristic for the impedance of the compartment, and which in the presence of the at least one particle changes in a predetermined way, wherein focusing of the at least one particle takes place in a predetermined space relative to the impedance detector, wherein focusing involves a movement of the at least one particle relative to the fluid flowing in the compartment as a result of dielectrophoretic forces, which forces are exerted by means of at least two focusing electrodes ( 30 ).
申请公布号 US2006243594(A1) 申请公布日期 2006.11.02
申请号 US20030523175 申请日期 2003.07.28
申请人 SCHNELLE THOMAS;MUELLER TORSTEN;SHIRLEY STEPHEN 发明人 SCHNELLE THOMAS;MUELLER TORSTEN;SHIRLEY STEPHEN
分类号 B03C5/02;G01N15/12 主分类号 B03C5/02
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