发明名称 Method, system, and article of manufacture for fault determination
摘要 Provided are a method, system and article of manufacture for fault determination. A duration of time is determined for receiving an event. A plurality of events are received in a time period that is at least twice the determined duration. A plurality of factors are determined corresponding to the plurality of events. At least one factor is determined from the plurality of factors, wherein the at least one factor is a cause of at least one of the plurality of events.
申请公布号 US7131032(B2) 申请公布日期 2006.10.31
申请号 US20030389642 申请日期 2003.03.13
申请人 SUN MICROSYSTEMS, INC. 发明人 GIBSON GAVIN G.;MCKENNEY TODD H.;CADIEUX CHRISTIAN;KISER PAULA C.
分类号 G06F11/00;H04L1/22 主分类号 G06F11/00
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