发明名称 |
Method, system, and article of manufacture for fault determination |
摘要 |
Provided are a method, system and article of manufacture for fault determination. A duration of time is determined for receiving an event. A plurality of events are received in a time period that is at least twice the determined duration. A plurality of factors are determined corresponding to the plurality of events. At least one factor is determined from the plurality of factors, wherein the at least one factor is a cause of at least one of the plurality of events.
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申请公布号 |
US7131032(B2) |
申请公布日期 |
2006.10.31 |
申请号 |
US20030389642 |
申请日期 |
2003.03.13 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
GIBSON GAVIN G.;MCKENNEY TODD H.;CADIEUX CHRISTIAN;KISER PAULA C. |
分类号 |
G06F11/00;H04L1/22 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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