发明名称 |
Method and system for handling substrates in a production line including a cluster tool and a metrology tool |
摘要 |
In a production line, a cluster tool having a plurality of substantially identical process modules and a metrology tool includes a control unit that allows one to receive, store and process information that indicates in which process module which substrates have been processed and which selects, on the basis of the process information, which substrate has to be subjected to a measurement. Advantageously, the substrates are selected so that each process module is represented by a corresponding substrate to be measured in order to reliably monitor the process quality of each process module.
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申请公布号 |
US7130762(B2) |
申请公布日期 |
2006.10.31 |
申请号 |
US20030360314 |
申请日期 |
2003.02.07 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
HELLIG KAY;GOERIGK PETER;LIEBOLD UWE;GRUENZ RONALD;FANDREY KARL-HEINZ |
分类号 |
G06F17/18;G03F7/20;G05B19/418;G06F19/00;H01L21/00 |
主分类号 |
G06F17/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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