| 摘要 |
PROBLEM TO BE SOLVED: To acquire a structure capable of reducing greatly area overhead, in a semiconductor integrated circuit having a test constitution using a partially-rotating type scan circuit. SOLUTION: In this semiconductor integrated circuit having the test constitution equipped with a combinational circuit 3 and a scan chain 2 constituted by performing chain connection of a plurality of flip-flops 5 for scanning, the scan chain 2 is divided into a plurality of partial scan chains 20a-20n, and each partial scan chain 20a-20n has a partially-rotational scanning (PRS) function and a test response compression (MISR) function. A scan test is executed in a plurality of steps by changing combination between a partial scan chain set as PRS and a partial scan chain set as MISR, and thereby the test can be performed without installing a test response compressor separately from the scan chain, to thereby reduce the area overhead. COPYRIGHT: (C)2007,JPO&INPIT
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