发明名称 |
ELECTROSTATIC PROTECTION DEVICE FOR SEMICONDUCTOR CIRCUIT |
摘要 |
An electrostatic protection device for a semiconductor circuit is provided to stably protect an internal circuit by preventing a melting of a wiring due to a current concentration. A plurality of bar type second conductive diffusion regions(420) are formed to be spaced apart from each other in a first conductive substrate(400). A device isolation film(430) is formed at a surface of the substrate to enclose the second conductive diffusion regions. A first conductive diffusion region(410) is formed in a surface of the substrate except for the second conductive diffusion region and the device isolation region. A first wiring(450) is formed at an upper portion of the first conductive diffusion region to contact with the first conductive diffusion region. A second wiring is formed to contact with the second conductive diffusion regions to have a width corresponding to a long direction length of the second conductive diffusion region.
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申请公布号 |
KR100639222(B1) |
申请公布日期 |
2006.10.20 |
申请号 |
KR20050128609 |
申请日期 |
2005.12.23 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KWAK, KOOK WHEE;LEE, YOON SUNG |
分类号 |
H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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