发明名称 ELECTROSTATIC PROTECTION DEVICE FOR SEMICONDUCTOR CIRCUIT
摘要 An electrostatic protection device for a semiconductor circuit is provided to stably protect an internal circuit by preventing a melting of a wiring due to a current concentration. A plurality of bar type second conductive diffusion regions(420) are formed to be spaced apart from each other in a first conductive substrate(400). A device isolation film(430) is formed at a surface of the substrate to enclose the second conductive diffusion regions. A first conductive diffusion region(410) is formed in a surface of the substrate except for the second conductive diffusion region and the device isolation region. A first wiring(450) is formed at an upper portion of the first conductive diffusion region to contact with the first conductive diffusion region. A second wiring is formed to contact with the second conductive diffusion regions to have a width corresponding to a long direction length of the second conductive diffusion region.
申请公布号 KR100639222(B1) 申请公布日期 2006.10.20
申请号 KR20050128609 申请日期 2005.12.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWAK, KOOK WHEE;LEE, YOON SUNG
分类号 H01L27/04 主分类号 H01L27/04
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