发明名称 HOLE ROUGHNESS MEASURING TECHNIQUE AND DEVICE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a hole roughness measuring technique and a device thereof capable of assessing roughness easily by determining an optimum approximating curve even for out-of-round hole. SOLUTION: By irradiating energy line to a hole formed on an object to be measured to detect the reflected energy generated at the object to be measured, edges are detected from the center of hole in a radial pattern, the edge coordinates of the detected edges are convert to aθ-r plane, frequency components are determined by means of Fourier transformation on theθ-r plane, an approximating curve of an approximated hole of the hole on theθ-r plane is formed on the basis of the frequency components, and lastly the hole roughness can be measured from difference to the edge coordinates detecting the approximating curve concerned. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006284351(A) 申请公布日期 2006.10.19
申请号 JP20050104266 申请日期 2005.03.31
申请人 HITACHI HIGH-TECH SCIENCE SYSTEMS CORP 发明人 SUGAWARA HITOSHI
分类号 G01B15/00 主分类号 G01B15/00
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